XRD Peak Simulator

Cu Kα · λ = 1.5406 Å · Voigt profile

Reference Peak

2θ₀ 44.0°

20°80°

Intensity 1000

1005k

Quick presets

Broadening Effects

Crystallite size (Scherrer) 50 nm

3 nm200 nm

Microstrain ε (W–H) 2.0×10⁻³

00.02

Instrument broadening 0.10°

0.01°0.50°

Stacking faults α 0.00

00.25

Peak Shift Effects

Macrostrain / residual stress 0 MPa

−600 MPa+600 MPa

Thermal expansion ΔT 0°C

−400°C+400°C

Solid solution Δa/a 0.00×10⁻³

−8×10⁻³+8×10⁻³

Sample displacement 0 μm

−300 μm+300 μm

Display

Show reference peak

Show component curves

Add background noise

Show FWHM measurement

FWHM total

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Peak 2θ

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Shift Δ2θ

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d-spacing

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Cryst. size

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INTENSITY vs 2θ

Reference 2θ₀

Combined peak

Size contrib.

Strain contrib.

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